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IWLPC 2008 – WLP Metrology

Category:
  • Indium Corporation
  • Flux
  • If you end up at the 2008 International Wafer-Level Packaging Conference, make sure you check out the presentation for “Metrology in Wafer-Level Microsphere Processes”.  You’ll learn how you can actually ‘see’ flux with inspection equipment – a big challenge in our industry.