Comments

  1. Don Ballard:

    Have you looked into the experiments using lead free solders to reduce whiskering? I just read an article on whisker formation from the SMTA Series called "Whisker Formation Potential in Pb-Free Electroplated Connector Finishes" The following is an excerpt from the article:

    Although a truly meaningful tin whisker test will only arise once the actual mechanism for whisker initiation/growth is understood, appropriate acceleration factors are selected and confirmation is achieved. The tin whisker testing methodologies developed thus far use traditional environmental stresses such as elevated temperature, elevated humidity and thermal cycling between temperature extremes.

    Tin whiskering performance of a particular finish is known to depend strongly on a variety of factors, including surface oxide condition, electrodeposit thicknesses, composition of the barrier layer, level of residual stress, temperature and time.

    The military and aerospace industries have also examined tin on nickel along with other combinations that are much more expensive. Typically, nickel barrier layers in the neighborhood of 1-3 um are thick enough to block interdiffusion but not thick enough to make the interfaces brittle. 12-15 um of tin on 600-800 um of nickel has successfully hindered tin whisker growth.

    Many studies have examined specific electrodeposited finishes within controlled experiments using the above mentioned testing methodologies. Within the constraints of the aging conditions, plating chemistries and sample types utilized for studies, several conclusions can be reached. For pure tin electrodeposits, nickel barrier layers were significantly more effective than copper barrier layers in the suppression of whiskering. Matte tin and bright tin over nickel barrier layers did not whisker when subjected to the various environmental aging conditions in several studies. If nickel barriers are as effective as several prominent studies would indicate, the industry may indeed have a solution to the tin whisker problem

  2. Don Ballard:

    BTW- here is a good link with reference to the above: http://www.jedec.org/DOWNLOAD/search/JP002.pdf

    I am curious as to youir opinion Dr. Ron on the experiments and procedures.

  3. Don Ballard:

    http://www.circuitsassembly.com/pdf/0502/0502ca_digital.pdf

    The article in full is at the above link.

Comment on this entry

optional (will not appear online)
http://yoursite – optional (will appear online)

Important! Please find the letters in the image opposite, then type them into the box above. You are asked to do this in order to verify that this comment is not being submitted by an automated process.

top of page