White Papers

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Papers by Dr. Mikolaj E. Jozefowicz

• Electromigration vs. SIR

  by Dr. Mikolaj E. Jozefowicz, Dr. Ning-Cheng Lee

  The IPC-SF-818 Surface Insulation Resistance (SIR) test data taken with the use of a variety of halide-free no clean fluxes are analyzed against Bellcore TR-NWT-000078 Electromigration (EM) test data. Neither test results show correlation with bulk flux resistivity, flux water extract resistivity, flux residue moisture pickup, and flux corrosivity without bias. However, in the case of rosin fluxes, the insulation resistance behavior in both SIR and EM tests is a function of pH value of fluxes. This phenomenon is more profound in SIR test. In the case of low residue no clean fluxes, only SIR test displays such a pH dependent relationship. Data suggest that the 50 volts bias voltage used in SIR test may be responsible for this, and can be explained with a high-bias-voltage-induced electrolysis mechanism which is further promoted by a high pH environment. This failure mechanism is absent in EM test which utilizes 10 volts bias voltage, and probably will not occur at normal 5 volts application condition. Overall, the SIR test seems to be more stringent while the EM test appears to be more realistic.

  SIR, electromigration, solder, soldering, flux, EM, surface insulation resistance, no-clean, pb-free, lead-free

  [Permanent Link to this Paper]

  Posted on 1 Jan 2009

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