Papers about Reliability
by Jeffrey Chan, Scott Chen, Dr. Min Ding, Adriana Porras, Austin Huang, Anthony Gallagher, Dr. Weiping Liu, Dr. Ning-Cheng Lee
Chinese version of Achieving High Reliability Low Cost Lead-Free SAC Solder Joints Via MN or CE Doping.
CHINESE LANGUAGE, lead-free, Reliability, thermal cycling
[Permanent Link to this Paper ]
Posted on 6 May 2011
by Dr. Weiping Liu, Dr. Ning-Cheng Lee , Adriana Porras, Dr. Min Ding, Anthony Gallagher, Austin Huang, Scott Chen, Jeffrey Chan
In this study, the reliabilities of low Ag SAC alloys doped with Mn or Ce (SACM or SACC) were evaluated under JEDEC drop, dynamic bending, thermal cycling, and cyclic bending test conditions against eutectic SnPb, SAC105, and SAC305 alloys. The Mn or Ce doped low cost SAC105 alloys achieved a higher drop test and dynamic bending test reliability than SAC105 and SAC305, and exceeded SnPb for some test conditions. More significantly, being a slightly doped SAC105, both SACM and SACC matched SAC305 in thermal cycling performance. In other words, the low cost SACM and SACC achieved a better drop test performance than the low Ag SAC alloys plus the desired thermal cycling reliability of high Ag SAC alloys. The mechanism for high drop performance and high thermal cycling reliability can be attributed to a stabilized microstructure, with uniform distribution of fine IMC particles, presumably through the inclusion of Mn or Ce in the IMC. The cyclic bending results showed SAC305 being the best and all lead-free alloys are equal or superior to SnPb. The reliability test results also showed that NiAu is a preferred surface finish for BGA packages over OSP.
thermal cycling, Reliability, lead-free
[Permanent Link to this Paper ]
Posted on 2 Mar 2010
by Dr. Ning-Cheng Lee
Package-on-package (PoP) is a packaging that rapidly prevails in mobile devices of the electronic industry, due to its flexibility in combining memory and processor into one component with a reasonably low profile. However, similar to BGA, the solder joints of assembled PoP are prone to cracking upon dropping onto the floor, thus needing reinforcement by underfilling. The underfilling process needs an underfill material plus additional dispensing equipment, dispensing and flowing steps, and subsequent time-consuming curing. Furthermore, underfilled PoP suffers solder extrusion upon rework, particularly when reworking at the opposite side of the board right underneath the PoP. Epoxy flux is a new material developed to address the issues described above; it is a liquid epoxy with fluxing power, and it is compatible with solder paste. Applied by a dipping process, epoxy flux can be used at the mounting of bottom package and top package. First, the bottom package is dipped in a film of epoxy flux, and then placed onto the footprint pad on a PCB with or without solder paste. Then, the top package is dipped in epoxy flux and placed on top of the bottom package. The PCB with a stacked PoP is subsequently reflowed in the oven together with other surface mount components placed on printed solder paste. Epoxy flux combines soldering and reinforcement into one single process. With a controlled pick up flux volume, a venting channel is formed, allowing outgassing at reflow. The low stress characteristics of epoxy flux prevents the formation of solder extrusion. Overall, epoxy flux provides a low cost and high reliability solution for PoP assembly.
Reliability, soldering, assembly, PoP, package-on-package, epoxy flux
[Permanent Link to this Paper ]
Posted on 14 Oct 2011
by Eric Bastow , Timothy Jensen
The advent of the EU’s RoHS law has encouraged a significant amount of research to find an alloy, for electronic assembly that will satisfy RoHS’s lead-free requirement and have optimum process ability and field reliability. The resulting research, much of it lead by iNEMI, resulted in the near eutectic tin-silver-copper alloy SAC387 (Sn95.5Ag3.8Cu0.7) as an initial favorite to fill this need in the early 2000s. By 2004 or so, many people were using SAC305, partially because of its greater resistance to tombstoning. It appeared that SAC305 would become the de-facto lead-free standard alloy for RoHS compliant electronic assembly. However, with the dramatic increase in silver prices in the last few years, SAC105, having 2% less silver was being evaluated and used for its obvious cost savings. Reliability testing of SAC105 also showed that although it did not perform as well as SAC305 in thermal fatigue cycle testing, it was better than SAC305 in drop shock tests. The explosive growth of mobile phone sales, over 1 billion per year, made SAC105’s superior drop shock performance attractive for these and other portable devices.
In addition to research relating to SAC305 and SAC105, much work has been performed on the study of the effects of small quantities (<0.1%) of alloying metals on lead-free alloys’ process ability and reliability performance. These "dopants" can dramatically affect an alloy’s performance.
All of the above work has resulted in what many are calling lead-free alloy proliferation as more and more alloys are being considered for implementation. This proliferation drives up solder paste cost as manufacturers cannot achieve economies of scale. In addition, with so many alloys to consider, it is difficult for researchers to develop extensive data bases of process and reliability performance.
This paper is an overview of this lead-free alloy proliferation and an outlook on how alloy convergence might occur.
solder, SAC, pb-free, dopants, Reliability, thermal cycling, drop testing
[Permanent Link to this Paper ]
Posted on 15 Oct 2009
