Papers about no-clean
by Paul A. Jaeger, Dr. Ning-Cheng Lee
As one of the major approaches to address the CFC issue, no-clean solder paste has received rapidly increasing attention. Although currently the industry seems to accept full residue paste as a temporary solution, the low residue no-clean paste technology using inert or reactive atmosphere advances immensely to meet the challenge. Presently consensus has not been established yet regarding how low a residue level could be achieved and how inert the atmospheres needs to be. In this study, a semi-empirical model is proposed to predict the soldering performance of low residue solder pastes under various levels of inert reflow atmosphere. The model predicts that the soldering performance would improve rapidly then gradually level off with decreasing oxygen content. The soldering performance vs oxygen content curves are superimposable, with the lower residue one leveling off at lower oxygen level. In general, the experimental data match this model fairly well. However, the data also indicate that, although inert atmosphere improves soldering performance, the optimum condition for bond strength performance seems to demand the presence of some oxygen. This unexpected behavior suggests that a very tight low oxygen level control may not be required. The mechanism responsible for this phenomenon can be attributed to oxidation-induced resin crosslinking. This slows down the flux drying rate as well as hinders the permeation of oxygen through the flux layer.
lead-free, pb-free, nitrogen, flux, reflow, soldering, low-residue, no-clean, solder paste, solder
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Posted on 1 Jan 2009
by Dr. Ning-Cheng Lee , Dr. Mikolaj E. Jozefowicz
The IPC-SF-818 Surface Insulation Resistance (SIR) test data taken with the use of a variety of
halide-free no clean fluxes are analyzed against Bellcore TR-NWT-000078 Electromigration (EM) test data. Neither test results show correlation with bulk flux resistivity, flux water extract resistivity, flux residue moisture pickup, and flux corrosivity without bias. However, in the case of rosin fluxes, the insulation resistance behavior in both SIR and EM tests is a function of pH value of fluxes. This phenomenon is more profound in SIR test. In the case of low residue no clean fluxes, only SIR test displays such a pH dependent relationship. Data suggest that the 50 volts bias voltage used in SIR test may be responsible for this, and can be explained with a high-bias-voltage-induced electrolysis mechanism which is further promoted by a high pH environment. This failure mechanism is absent in EM test which utilizes 10 volts bias voltage, and probably will not occur at normal 5 volts application condition. Overall, the SIR test seems to be more stringent while the EM test appears to be more realistic.
lead-free, pb-free, no-clean, surface insulation resistance, EM, flux, soldering, solder, electromigration, SIR
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Posted on 1 Jan 2009
by Dr. Ning-Cheng Lee
No-clean soldering process is the cheapest available process alternatives in the post-CFC era. In order to enjoy the benefit of no-clean process, care should be taken to assure the cleanliness of products before and after assembly. In addition, the no- clean soldering materials have to be properly formulated in order to deliver the high reliability and adequate flux residue appearance. Due to the elimination of cleaning process, issues such as solder beading, solder balling, probe testability, wire bondability, compatibility with polymeric coatings or wave soldering fluxes have to be addressed. No-clean fluxes typically utilize hydrophobic chemicals and often are in line with RMA flux chemistries. Nitrogen is required if a low residue level is desired for reflow process. Some conventional testing methods may not be adequate for evaluating no-clean soldering materials. Concurrent trends of shifting toward finer pitch, higher reliability, lower residue, and air reflow processes pose a great challenge for no-clean soldering process.
lead-free, pb-free, paste, flux, soldering, solder, no-clean
[Permanent Link to this Paper ]
Posted on 1 Jan 2009
by Dr. Ning-Cheng Lee , Paul A. Jaeger, Manchao Xiao
The probe-testability of no-clean solder paste flux residue at in-circuit-test is determined mainly by the residue amount, residue location, and residue hardness. The testability increases with decreasing amount of residue, decreasing amount of top-side flux spread, and increasing amount of bottom-side flux spread. The residue amount, top-side flux spread, and bottom-side flux spread affect primarily pad probing, pad probing, and pin-tip probing, respectively. Inert reflow atmosphere helps probe penetration. Higher metal load effectively reduces the flux spreading. Among all, the soft residue approach appears to be most promising in providing successful probe contact.
lead-free, pb-free, no-clean, flux residue, solder paste, testability, probe
[Permanent Link to this Paper ]
Posted on 1 Jan 2009
by Dr. Ning-Cheng Lee , Dr. Arnab Dasgupta, Dr. Runsheng Mao, Dr. Yan Liu
Electronic industry has been driven toward lead-free by RoHS (Restriction of Hazardous Substances Directive) which is in force since 2006. Recently REACH (Registration, Evaluation and Authorization of Chemicals) further drives the industry toward halogen-free. As a result, solder pastes for PCB assembly are required or desired to be both lead-free and halogen-free. Lead-free solder alloys in general wet poorer than tin-lead due to the higher surface tension of the former alloys. In the mean time, halogen-free fluxes typically also wet poorer than the more powerful halogen-containing fluxes. Consequently, the lead-free and halogen-free solder paste products that emerged inevitably suffer from a considerably inferior soldering performance than that of conventional halogen-containing tin-lead solder pastes. The deficiencies include poor wetting, solder balling, voiding, graping, head-in-pillow, etc. This gap is particularly significant for fine-pitch applications where the impact of oxidation is more profound. Furthermore, the higher soldering temperature of the higher melting lead-free alloys also aggravates the challenge of in-circuit test for no- clean processes, mainly due to the difficulty for probe to penetrate through the toughened flux residue. Although use of inert reflow atmosphere may alleviate some of the problems, the higher cost of it is prohibitive for most of the manufacturing firms. In this work, a halogen-free lead-free no-clean solder paste system, Indium8.9HF series, has been developed. It exhibits superior oxidation tolerance, thus assures superior resistance against graping, head-in-pillow, solder balling, voiding, and poor wetting for miniaturized electronic applications. In spite of the immense challenge in material science, this system also shows outstanding probe testability, in addition to its very good printability, non- slump, SIR, and ECM performance. The superior performance of this Indium8.9HF system effectively sealed the gap caused by lead-free and halogen-free requirements.
lead-free, halogen-free, no-clean, solder, solder paste, miniaturization, graping, head-in-pillow, voiding, solder balling, probe testability, ICT, oxidation
[Permanent Link to this Paper ]
Posted on 1 Jan 2009
