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Indium Corporation conducts extensive research on the soldering fundamentals for Surface Mount Technology and other electronics applications.

Browse our library for abstracts of some of the most popular published articles that you may find useful in your efforts to improve your process results. All papers in our library are available for download.

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    Papers about thermal cycling

  • Achieving High Reliability Low Cost Lead-Free SAC Solder Joints Via MN or CE Doping (Chinese)

    by Jeffrey Chan, Scott Chen, Dr. Min Ding, Adriana Porras, Austin Huang, Anthony Gallagher, Dr. Weiping Liu, Dr. Ning-Cheng Lee

    Chinese version of Achieving High Reliability Low Cost Lead-Free SAC Solder Joints Via MN or CE Doping.

    CHINESE LANGUAGE, lead-free, Reliability, thermal cycling

    Posted on 6 May 2011

  • Achieving High Reliability Low Cost Lead-Free SAC Solder Joints Via MN or CE Doping (English)

    by Dr. Weiping Liu, Dr. Ning-Cheng Lee, Adriana Porras, Dr. Min Ding, Anthony Gallagher, Austin Huang, Scott Chen, Jeffrey Chan

    In this study, the reliabilities of low Ag SAC alloys doped with Mn or Ce (SACM or SACC) were evaluated under JEDEC drop, dynamic bending, thermal cycling, and cyclic bending test conditions against eutectic SnPb, SAC105, and SAC305 alloys. The Mn or Ce doped low cost SAC105 alloys achieved a higher drop test and dynamic bending test reliability than SAC105 and SAC305, and exceeded SnPb for some test conditions. More significantly, being a slightly doped SAC105, both SACM and SACC matched SAC305 in thermal cycling performance. In other words, the low cost SACM and SACC achieved a better drop test performance than the low Ag SAC alloys plus the desired thermal cycling reliability of high Ag SAC alloys. The mechanism for high drop performance and high thermal cycling reliability can be attributed to a stabilized microstructure, with uniform distribution of fine IMC particles, presumably through the inclusion of Mn or Ce in the IMC. The cyclic bending results showed SAC305 being the best and all lead-free alloys are equal or superior to SnPb. The reliability test results also showed that NiAu is a preferred surface finish for BGA packages over OSP.

    thermal cycling, Reliability, lead-free

    Posted on 2 Mar 2010

  • The Proliferation of Lead-Free Alloys

    by Eric Bastow, Timothy Jensen

    The advent of the EU’s RoHS law has encouraged a significant amount of research to find an alloy, for electronic assembly that will satisfy RoHS’s lead-free requirement and have optimum process ability and field reliability. The resulting research, much of it lead by iNEMI, resulted in the near eutectic tin-silver-copper alloy SAC387 (Sn95.5Ag3.8Cu0.7) as an initial favorite to fill this need in the early 2000s. By 2004 or so, many people were using SAC305, partially because of its greater resistance to tombstoning. It appeared that SAC305 would become the de-facto lead-free standard alloy for RoHS compliant electronic assembly. However, with the dramatic increase in silver prices in the last few years, SAC105, having 2% less silver was being evaluated and used for its obvious cost savings. Reliability testing of SAC105 also showed that although it did not perform as well as SAC305 in thermal fatigue cycle testing, it was better than SAC305 in drop shock tests. The explosive growth of mobile phone sales, over 1 billion per year, made SAC105’s superior drop shock performance attractive for these and other portable devices.

    In addition to research relating to SAC305 and SAC105, much work has been performed on the study of the effects of small quantities (<0.1%) of alloying metals on lead-free alloys’ process ability and reliability performance. These "dopants" can dramatically affect an alloy’s performance.

    All of the above work has resulted in what many are calling lead-free alloy proliferation as more and more alloys are being considered for implementation. This proliferation drives up solder paste cost as manufacturers cannot achieve economies of scale. In addition, with so many alloys to consider, it is difficult for researchers to develop extensive data bases of process and reliability performance.

    This paper is an overview of this lead-free alloy proliferation and an outlook on how alloy convergence might occur.

    solder, SAC, pb-free, dopants, Reliability, thermal cycling, drop testing

    Posted on 15 Oct 2009

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