by Karl Pfluke , Dr. Ronald C. Lasky , Ross B. Berntson
Surface mount assembly has dominated its through-hole predecessor since the early 1990s. The higher density and lower ultimate cost of SMT makes it a preferred assembly technology. However, the mechanical strength of through-hole connections continues to make through-hole the technology of choice in assembling connectors. This presentation will describe the primary methods currently used for through-hole connector assembly: 1) selective wave solder, 2) pin-in-paste (PIP)i reflow, 3) hand soldering and 4) solder preforms. We will show how solder preforms are an excellent alternative when PIP provides insufficient solder.
The wave solder method requires specialized equipment and processes to solder connectors. Pin-in- paste reflow evolved as a way to accomplish through-hole assembly without additional equipment or process steps. In the PIP method, the additional solder required to fill the though-hole barrel is deposited by overprinting the pad in the area of each connector pin, using standard SMT equipment. During reflow, the solder wicks to each pin forming the solder fillet.
This paper explains why pin-through-paste reflow methods based on overprinting solder paste have become more challenging due to an increasing use of Organic Solderability Preservative (OSP), fine- feature devices (e.g. fine pitch connectors) and densely populated PCB layout designs that conflict with requirements for successful use of step-stencils. This paper also shows an example where solder preforms were used to provide extra solder volume for each pin. This work demonstrates how solder preforms provide a viable manufacturing solution to ensure complete through-hole solder joints.
lead-free, pb-free, through-hole connectors, selective wave soldering, mixed technology, intrusive reflow, pin-in-paste, solder preforms
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Posted on 1 Jan 2009
by Dr. Chingchen S. Chiu, Dr. Ning-Cheng Lee , Kimbela Randle, Christopher Parrish
Voiding in BGA at Sn63 solder bumping stage typically occurs at the interface of eutectic solder and the BGA pad, due to the tendency of forming minimal molten solder surface area at bubble surface . At low voiding level, Pb90 bump systems exhibit more voiding than eutectic Sn-Pb bump systems, primarily due to the sandwich effect which entraps fume bubbles for Pb90 systems. However, at high voiding level, Pb90 bump systems exhibits less voiding than eutectic Sn-Pb bump systems, due to the radius of curvature effect which compresses the bubble size of Pb90 bump systems. In general, the voiding in BGA at solder bumping stage increases with decreasing flux activity, decreasing flux or paste deposition thickness, increasing oxide level of spheres or pads, increasing pad dimension, increasing reflow profile length, and increasing metal content. The sphere oxide effect is more pronounced for Pb90 bump systems than for eutectic Sn-Pb bump systems, due to the immobilized oxide for the former systems as well as the sandwich effect . Voiding also increases with decreasing flux/paste viscosity, presumably due to a decrease in the flux capacity. No correlation can be identified between voiding and flux volatility. The mechanisms of voiding unveiled suggest that the preferential location of voids at interface is inevitable, and use of high melting point sphere for solder bumping helps confining the void size. Surface tension is the most crucial property dictating voiding. It influences the voiding phenomena via tendency of forming minimal liquid surface area at bubble surface and radius of curvature effect .
through-hole connectors, pb-free, lead-free
[Permanent Link to this Paper ]
Posted on 1 Jan 2009
