應用
半導體測試
The most stringent application requirements for thermal interface materials (TIMs) are found in semiconductor testing. This environment presents challenges such as increased power, elevated heat flux, larger die sizes, and greater warpage that must be effectively managed. For semiconductor testing, compressible soft metal alloys like indium have become the industry standard. Specifically engineered for system-level test, functional test, and burn-in and testing processes, these recyclable materials support multiple insertions, improve process yields, and offer ease of use.


概述
使用 Heat-Spring® HSK 提高製程良率
Heat-Spring® HSK 一側為紋理圖案,另一側為覆鋁阻隔層,可確保經過多次插入後仍然耐用。面對被測元件 (DUT) 的薄鋁層可防止軟金屬附著在表面,有效降低污漬和裂痕的風險。
優點
增強不平整表面的間隙填充和熱能性能
永續 TIM
金屬 TIM 易於處理,100% 可回收,退貨時可抵用。可根據工作溫度要求提供多種合金。
靈活
適應性格式可彎曲達 90°,並可包覆各種測試頭/插座蓋配置,包括萬向測試頭。
效能
表面圖案設計可降低接觸電阻,在 50 psi 的壓力下提供媲美焊錫的熱績效。此外,還提供壓力更低的新選項。
多重插入
DUT 上的覆鋁層可防止沾污和黏著,使其可使用數百個週期。
Semiconductor Test Products
我們所有的熱介面材料都是金屬基材質,這意味著與聚合物基熱介面材料相比,它們具有非常高的導電率。
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