Full Autonomous Autos: Decades Away and In Need Of Unprecendented Reliability
I stand by my position that a fully functional self-driving car is decades away....
Solder Reliability
Self-Driving Vehicles Will Require Unprecedented Reliability
Autonomous (driverless, self-driving) cars will require unprecedented software and hardware reliability. Let's explore....
Smartwatches Will Never Be A Dominant Technology
I don't believe smartwatches will survive. Here are my reasons why....
Sustaining Process Improvement is Often the Most Difficult Task
Often slightly more expensive materials and equipment, in the long run, are associated with greater profitability due to their positive impact on the ...
SMT Reflow Profiling: Using ReflowCoach®
This video is for electronics assembly engineers, technicians, and managers who are looking to match a reflow profile to solder paste specifications. ...
In SMT Statistical Process Control, Cpk is King
In SMT Statistical Process Control, the bottom line is that Cpk is king. Here's the proof....
Conclusion of In Electronics Manufacturing, Does Cpk =1 Yield 66,800 defects per million?
Patty, Rob and Pete were quite sure they understood the confusion in the Cpk = 1 issue, but wanted to make sure they discussed it with the Professor.&...
In Electronics Manufacturing, Does Cpk =1 Yield 66,800 defects per million?
Folks, Patty was walking past the Professor’s office on her way to see Pete and Rob and she thought she would stop in. “Professor, I got t...
Solder Joint Failure Implicated in AirAsia Flight 8501 Crash
Solder Joint Failure Implicated in AirAsia Flight 8501 Crash: Patty was heading down to the Professor’s office to discuss the Reliability Engine...
Use the Coffin-Manson Equation to Calculate Number of Thermal Cycles
Patty, Rob, and Pete were headed to their regular monthly meeting where they, along with the Professor, discussed a book they were all reading....
4B or not 4B?... The Difference in the IPC Test Requirements for "no-clean" L0 Type Soldering Fluxes
Overall we believe that while the J-STD-004B standard may not be perfect and subject to future further evolution, it does provide the best available m...
Conclusion to The Rule of 3/N for Estimating Field Failure Rates in Electronics Assembly
Folks, Let’s see how Patty, Rob and Pete are doing helping Mike Madigan establish his “Zero Defects” program….. “So let...