Tin whiskers continue to be a major concern in electronics assembly. This workshop will start with an explanation of tin whiskers and their formation. Then, it will summarize their potential risks and mitigation techniques. A description of Failure Modes and Effects Analysis (FMEA) as a technique to assess tin whisker risk, for a given technology, will then be discussed.
Presenter Dr. Ron Lasky will conclude this workshop with a discussion of tin whisker reliability strategies for consumer and mission critical products. At the end of the presentation, attendees will have all of the basic relevant information to develop an effective tin whisker strategy.Less