If you end up at the 2008 International Wafer-Level Packaging Conference, make sure you check out the presentation for “Metrology in Wafer-Level Microsphere Processes”. You’ll learn how you can actually ‘see’ flux with inspection equipment – a big challenge in our industry.
IWLPC 2008 – WLP Metrology
Indium Corporation Blogging Team
Indium Corporation Blogging Team
Our blogging team includes engineers, researchers, product specialists, and industry leaders. We share expertise in solder materials, electronics assembly, thermal management, and advanced manufacturing. Our blog offers insights, technical knowledge, and solutions to inspire professionals, showcasing product innovations, trends, and best practices to help readers excel in a competitive industry.
